M. Aoyama

Japan Atomic Energy Agency

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Y. Akahane

The University of Tokyo

K. Yamakawa

Shizuoka University

Koichi Yamakawa

National Institutes for Quantum and Radiological Science and Technology

K. Tsuji

Hokkaido University

K. Ogawa

SPring-8

Norihiro Inoue

Hitachi Zosen (Japan)

Yuji Fukuda

National Institutes for Quantum and Radiological Science and Technology

H. Nishioka

University of Electro-Communications

Tetsuo Harimoto

University of Yamanashi

Katsumi Midorikawa

RIKEN

Cooperative Institutions

Osaka University

193

The University of Tokyo

Kyoto University

Institute for Laser Technology

Japan Atomic Energy Agency

Tohoku University

RIKEN

Advanced Science Research Center

Japan Science and Technology Agency

Nagoya University

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Optimized energetic particle emissions from Xe clusters in intense laser fields

Physical Review A (2003)

Yuji Fukuda Koichi Yamakawa Y. Akahane M. Aoyama Norihiro Inoue

We have probed the interaction of intense laser fields with Xe clusters by measuring the energy and charge state distributions of emitted ions and electrons using ultrafast 20-fs pulses. This work demonstrates that the energetic particle emissions from laser-cluster interactions can be optimized by manipulating the character of ultrafast laser pulses, i.e., pulse duration and sign of chirp. The mean and maximum ion energies as high as 0.1 and 2 MeV, respectively, are achieved when Xe clusters are irradiated by 500-fs pulses with negative chirp as an optimal condition under a laser peak intensity of $2\ifmmode\times\else\texttimes\fi{}{10}^{17}{\mathrm{W}/\mathrm{c}\mathrm{m}}^{2}.$ The mean ion energy obtained from 500-fs pulses with negative chirp is found to be about 1.6 times larger than that with positive chirp.

Chirp

10.1103/physreva.67.061201

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Citations (61)

Characterization of a 1020 W · cm−2 Peak Intensity by Focusing Wavefront-corrected 100-TW, 10-Hz Laser Pulses

Springer series in optical sciences/SPringer series in optical sciences (2007)

Y. Akahane Jinglong Ma Yuji Fukuda M. Aoyama Hiromitsu Kiriyama

Intensity

10.1007/978-0-387-49119-6_44

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Citations (0)

Multi-Photon Ionization of Atoms and Molecules by Intense XUV-FEL Light: Application to Methanol and Ethanol Molecules

The Review of Laser Engineering (2009)

Takahiro Sato Atsushi Iwasaki Tomoya Okino Kaoru Yamanouchi A. Yagishita

The photo-ionization processes of methanol (CH3OH, CD3OH) and ethanol (C2H5OH) and their

Extreme ultraviolet

10.2184/lsj.37.905

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Citations (5)

X-ray radiation properties of micron-sized clusters under the action of superintense laser radiation

Yuji Fukuda Y. Akahane M. Aoyama Norihiro Inoue Hiroshi Ueda

High resolution K-shell spectra of a plasma created by laser irradiation of micron-sized Ar clusters have been measured with an intensity above 1019 W/cm2 and a pulse duration of 30 fs

Pulse duration

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Citations (0)

Compact soft x-ray laser pumped by a pulse-train laser

K. Ande T. Hara Y. Aoyagi M. Aoyama

10.1109/cleopr.1995.521233

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Temporal overlapping for HHG seeded EUV-FEL operation by using EOS-based timing-drift controlling system

Shinichi Matsubara Tadashi Togashi Eiichi Takahashi Katsumi Midorikawa M. Aoyama

Free-electron lasers (FELs), which are based on a self-amplified spontaneous emission (SASE) scheme, have attractive characters as the intense light source in short-wavelength region. However, their temporal profile and frequency-domain spectra have shot-to-shot fluctuating spikes originated from the SASE process. One of the promising approaches to these problems is a seeded FEL scheme, which is possible to realize full-coherent light pulses without shot-noise structures. We already reported the higher-order harmonic (HH) seeded FEL operation at the fundamental wavelength of 61.2 nm using a seeding source of a HH pulses from Ti:sapphire laser at the SPring-8 Compact SASE Source (SCSS) test accelerator. However, the seeded FEL pulses (intensity >4σ of SASE) were only obtained 0.3% in 3000 shots.

Extreme Ultraviolet Lithography

Amplified spontaneous emission

Harmonic

10.1109/cleoe-iqec.2013.6801063

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Citations (0)

<title>Spectroellipsometric study of sulphur passivation of InAs</title>

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (1996)

Tomuo Yamaguchi K. Ohshimo Ahalapitiya H. Jayatissa M. Aoyama Xiaonan Gong

Sulphur passivation of InAs is studied by spectroscopic ellipsometry. Time dependence of (Psi) and (Delta) of InAs surface after etching as well as after sulphur passivation has been measured in air. The empirical dielectric function for amorphous material proposed in the previous paper has been applied to the surface. Differences between dielectric function and thickness of surface layers with and without passivation and their time dependence after each treatment have clearly been observed.

Passivation

Ellipsometry

Dielectric function

10.1117/12.246242

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Citations (1)

A Simulation Code for Tempo-Spatial Analysis of Three-Wave Interaction with Ultrashort- and Ultrahigh-Intensity Laser Pulses : Optics and Quantum Electronics

Japanese journal of applied physics. Pt. 1, Regular papers & short notes (2001)

Tiejun Zhang Motoki Yonemura M. Aoyama Koichi Yamakawa

Intensity

Ultrafast optics

Source