E. V. Sobolev

European X-Ray Free-Electron Laser

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Richard Bean

European X-Ray Free-Electron Laser

D. A. Tikhonov

Institute of Theoretical and Experimental Biophysics

Adrian P. Mancuso⋈

European X-Ray Free-Electron Laser

Luca Gelisio

European X-Ray Free-Electron Laser

Victor S. Lamzin

European Molecular Biology Laboratory

Henry Kirkwood

European X-Ray Free-Electron Laser

Grzegorz Chojnowski

European Molecular Biology Laboratory

Henry N. Chapman

Universität Hamburg

Adam Round

European X-Ray Free-Electron Laser

ВЛ

В.Д. Лахно

Institute of Mathematical Problems of Biology

Cooperative Institutions

European X-Ray Free-Electron Laser

110

Deutsches Elektronen-Synchrotron DESY

Universität Hamburg

Russian Academy of Sciences

Center for Free-Electron Laser Science

SLAC National Accelerator Laboratory

Max Planck Institute for the Structure and Dynamics of Matter

University of York

University of Oxford

Diamond Light Source

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Origin of the extrareflections of the “spine” type in laue photograph of natural diamonds

Journal of Structural Chemistry (1966)

E. V. Sobolev G. B. Bokii V. I. Lisoivan V. F. Dvoryankin

Solid-state physics

10.1007/bf00779346

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Citations (0)

Some anomalies in the vibrational spectra of ?, ?-unsaturated ketones

Bulletin of the Academy of Sciences of the USSR Division of Chemical Science (1963)

E. V. Sobolev V. T. Aleksanyan

Sequence (biology)

Phase difference

Vibrational spectrum

10.1007/bf00849689

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Some general characteristic properties of substituted cyclopentadienes

Tetrahedron (1963)

В. А. Миронов E. V. Sobolev A. N. Elizarova

Cyclopentadiene

Cyclopentadienyl complex

Methylene

Structural isomer

10.1016/0040-4020(63)85008-5

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Citations (177)

Megahertz single-particle imaging at the European XFEL

arXiv (Cornell University) (2019)

E. V. Sobolev С. Н. Золотарев Klaus Giewekemeyer Johan Bielecki Kenta Okamoto

The emergence of high repetition-rate X-ray free-electron lasers (XFELs) powered by superconducting accelerator technology enables the measurement of significantly more experimental data per day than was previously possible. The European XFEL will soon provide 27,000 pulses per second, more than two orders of magnitude more than any other XFEL. The increased pulse rate is a key enabling factor for single-particle X-ray diffractive imaging, which relies on averaging the weak diffraction signal from single biological particles. Taking full advantage of this new capability requires that all experimental steps, from sample preparation and delivery to the acquisition of diffraction patterns, are compatible with the increased pulse repetition rate. Here, we show that single-particle imaging can be performed using X-ray pulses at megahertz repetition rates. The obtained results pave the way towards exploiting high repetition-rate X-ray free-electron lasers for single-particle imaging at their full repetition rate.

Repetition (rhetorical device)

Pulse repetition frequency

Particle (ecology)

10.48550/arxiv.1912.10796

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Thinner triplex from chemically strengthened glass

Glass and Ceramics (1984)

L. S. Bogatyrev N. E. Tikhomirova A. I. Kaprov E. V. Sobolev A. M. Chugunov

10.1007/bf00701596

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Online dynamic flat-field correction for MHz microscopy data at European XFEL

Journal of Synchrotron Radiation (2023)

Šarlota Birnšteinová Danilo E. Ferreira de Lima E. V. Sobolev Henry Kirkwood Valerio Bellucci

The high pulse intensity and repetition rate of the European X-ray Free-Electron Laser (EuXFEL) provide superior temporal resolution compared with other X-ray sources. In combination with MHz X-ray microscopy techniques, it offers a unique opportunity to achieve superior contrast and spatial resolution in applications demanding high temporal resolution. In both live visualization and offline data analysis for microscopy experiments, baseline normalization is essential for further processing steps such as phase retrieval and modal decomposition. In addition, access to normalized projections during data acquisition can play an important role in decision-making and improve the quality of the data. However, the stochastic nature of X-ray free-electron laser sources hinders the use of standard flat-field normalization methods during MHz X-ray microscopy experiments. Here, an online ( i.e. near real-time) dynamic flat-field correction method based on principal component analysis of dynamically evolving flat-field images is presented. The method is used for the normalization of individual X-ray projections and has been implemented as a near real-time analysis tool at the Single Particles, Clusters, and Biomolecules and Serial Femtosecond Crystallography (SPB/SFX) instrument of EuXFEL.

Normalization

10.1107/s1600577523007336

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Citations (2)

Some characteristics of equilibrium transformations of substituted cyclopentadienes

Bulletin of the Academy of Sciences of the USSR Division of Chemical Science (1962)

В. А. Миронов E. V. Sobolev A. N. Elizarova

10.1007/bf00921362

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Concerning the conformation of 2,4-dimethylpentadiene-1, 3 and 3-methylpentadiene-1,3

Journal of Structural Chemistry (1964)