Vu Thien Binh

Université Claude Bernard Lyon 1

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V. Semet

Laboratoire Ampère

M. Drechsler

University of Bremen

R. Uzan

Université Claude Bernard Lyon 1

M. Cahay

University of Cincinnati

Stephen T. Purcell

Centre National de la Recherche Scientifique

D. J. Lockwood

National Research Council Canada

Dominique Guillot

University of Delaware

Steven B. Fairchild

Wright-Patterson Air Force Base

R. Mouton

Université Claude Bernard Lyon 1

A. Piquet

Université Claude Bernard Lyon 1

Cooperative Institutions

Centre National de la Recherche Scientifique

Université Claude Bernard Lyon 1

University of Cambridge

Universidad Autónoma de Madrid

University of Cincinnati

United States Air Force Research Laboratory

Groupe de Physique des Matériaux

Consejo Superior de Investigaciones Científicas

Institute for Microstructural Sciences

Institut Lumière Matière

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Realization of an axially aligned Au-ion source of atomic size

Applied Physics Letters (1999)

Stephen T. Purcell Vu Thien Binh

Nanotips are high-brightness electron sources with a principal characteristic source-size of one atom. We explore here nanotips as a type of atom-size source of Au ions. Conditions were found for a reproducible fabrication of a single Au nanotip on the principal axis of a W-base tip that emitted a beam of Au exclusively from its apex. The measured source characteristics were (i) the atomic-size source; (ii) currents: 10−14–1012 A; (iii) stability: 5 h; (iv) beam opening angle: 3.2°; and (v) energy dispersion <1 eV. First focusing experiments showed crossover and that the entire emitted beam was focused.

Realization (probability)

Axial symmetry

10.1063/1.124684

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Citations (8)

Electron emission from ultra-thin multilayer cold cathodes

International Vacuum Nanoelectronics Conference (2011)

Vu Thien Binh

The specific field emission behavior of ultra-thin multilayer cold cathodes is put in perspective with the variable-resistor model for a memristor.

Source

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Fabrication and electrical characteristics of carbon nanotube-based microcathodes for use in a parallel electron-beam lithography system

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (2003)

K. B. K. Teo Manish Chhowalla G.A.J. Amaratunga W. I. Milne P. Legagneux

This article presents an overview of the “Nanolith” parallel electron-beam (e-beam) lithography approach. The e-beam writing head consists of an array of microguns independently driven by an active matrix complementary metal–oxide–semiconductor circuit. At the heart of each microgun is a field-emission microcathode comprised of an extraction gate and vertical carbon nanotube emitter, whose mutual alignment is critical in order to achieve highly focused electron beams. Thus, in this work, a single-mask, self-aligned technique is developed to pattern the extraction gate, insulator, and nanotubes in the microcathode. The microcathode examined here (150×150 gates, 2 μm gate diameter, with multiple nanotubes per gate) exhibited a peak current of 10.5 μA at 48 V when operated with a duty cycle of 0.5%. The self-aligned process was extended to demonstrate the fabrication of single nanotube-based microcathodes with submicron gates.

Next-generation lithography

10.1116/1.1545755

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Citations (93)

Solid-state field-controlled emitters: a thin-film technology solution for industrial cathodes

Solid-State Electronics (2001)

Vu Thien Binh J.P. Dupin Ch. Adessi V. Semet

Band bending

10.1016/s0038-1101(00)00217-3

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Citations (16)

On the evaporation rate of silicon

Surface Science Letters (1986)

J.L. Souchière Vu Thien Binh

10.1016/0167-2584(86)90425-1

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Citations (0)

Field emission from nanotips

Applied Surface Science (1997)

Vu Thien Binh Stephen T. Purcell

Nanometre

10.1016/s0169-4332(96)00734-9

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Citations (38)

Réalisation et étude d'un microscope à ombre par émission de champ

Revue de Physique Appliquée (1971)

A. Piquet H Roux Vu Thien Binh R. Uzan M. Drechsler

2014 Un microscope à ombre à effet de champ travaillant en ultra-vide est décrit ; il est construit pour l'étude des déformations morphologiques de pointes métalliques in situ.Le principe de mise au point et la variation du grossissement ont été étudiés en fonction des potentiels et des distances entre projecteur, objet et écran.On établit une relation entre les potentiels et les distances pour une bonne mise au point.On envisage les possibilités et les limites de ce microscope données par le grossissement, la résolution et la distorsion de l'image.Abstract.2014 An ultra high vacuum field emission shadow microscope is described, which shall be used to study shape changes of solids in situ.The principle of focusing and the variation of magnification are studied as a function of the potentials and the distances between emitter, object and screen.For good adjustement a relation between potentials and distances is given.Possibilities and limits of this type of microscope given by the magnification, the resolution and the image distorsion are discussed.Tome 6N° 2 JUIN 1971Introduction.-Les modifications morphologiques des solides à haute température sont influencées par l'adsorption.Nos études sur les pointes métalliques

10.1051/rphysap:0197100602010500

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Citations (3)

3D calculations at atomic scale of the electrostatic potential and field created by a teton tip

Ultramicroscopy (1992)

D. Atlan Georges Gardet Vu Thien Binh N. Garcı́a J. J. Sáenz

Hyperboloid

Atomic units

Electrostatics

Electric potential energy

Potential field

10.1016/0304-3991(92)90260-q