Michael Engstler

Saarland University

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Co-Authors

Frank Mücklich

Saarland University

Jenifer Barrirero

Saarland University

Magnus Odén

Linköping University

Christoph Pauly

Saarland University

Naureen Ghafoor

Linköping University

P. Rossi

Universidade Federal de Santa Catarina

Fernando Lasagni

Center for Advanced Aerospace Technologies

Dominik Britz

Saarland University

Andrés Fabián Lasagni

Fraunhofer Institute for Material and Beam Technology

Niels de Jonge

Leibniz-Institute for New Materials

Cooperative Institutions

Saarland University

Karlsruhe Institute of Technology

Deutsches Zentrum für Luft- und Raumfahrt e. V. (DLR)

Walter de Gruyter (Germany)

Steinbeis Foundation

Montanuniversität Leoben

Max Planck Society

Ruhr University Bochum

Centre National de la Recherche Scientifique

Leibniz-Institute for New Materials

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3D connectivity of eutectic Si as a key property defining strength of Al–Si alloys

Computational Materials Science (2016)

А. А. Круглова Michael Engstler Gerd Gaiselmann Ole Stenzel Volker Schmidt

10.1016/j.commatsci.2016.04.019

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Citations (25)

Serial Sectioning Techniques – a Versatile Method for Three-Dimensional Microstructural Imaging

Practical Metallography (2018)

Frank Mücklich Michael Engstler Dominik Britz Jessica Gola

Optical sectioning

10.3139/147.110535

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Citations (7)

From Correlative Microscopy to 3D Understanding of Material Microstructures

Microscopy and Microanalysis (2016)

Frank Muecklich Dominik Britz Michael Engstler

Correlative

10.1017/s143192761600088x

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Phase Selective Sample Preparation of Al-Si alloys for Atom Probe Tomography

Practical Metallography (2019)

Jenifer Barrirero Michael Engstler Magnus Odén Frank Mücklich

Abstract We present how the conventional focused ion beam (FIB) lift-out method can be modified to obtain phase selective specimens for atom probe tomography (APT). The modified method combines selective deep etching with site-specific lift-out using a micromanipulator in a FIB/SEM workstation. This method is used for phase-selective sample preparation in alloys with complex microstructures such as the coral- and plate-like silicon structures in the eutectic phase of Al-Si castings. The method proves to be both, practical and robust, with a high success rate of high-quality phase-specific APT specimens.

Micromanipulator

Atom probe

Sample Preparation

10.3139/147.110557

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Citations (2)

Characterization of Graphite Crystal Structure and Growth Mechanisms Using FIB and 3D Image Analysis

Advanced Engineering Materials (2010)

Alexandra Hatton Michael Engstler P. Leibenguth Frank Mücklich

Abstract Considering the significant influence of the morphology of graphite inclusions on the properties of cast iron it is important to understand the correlation between manufacturing parameters and resulting microstructure. In particular, understanding the effect of alloying elements and inoculants on the formation and growth mechanisms of the graphite particles provides the basis for exact tailoring of the microstructure and thus exact tailoring of effective properties of cast iron. Experimental observations of the three‐dimensional (3D) structure of graphite particles, high resolution chemical analysis of nuclei and other inclusions, as well as quantitative characterization of possible growth mechanisms have confirmed certain existing theoretical models for nodular and flake graphite and provided a comprehensive description of all intermediate morphologies. Precise analysis of the graphite's crystal structure based on target preparation of transmission electron microscope thin foils opens additional possibilities for estimating of the properties of different graphite types.

Characterization

Crystal (programming language)

10.1002/adem.201000234

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Citations (31)

Multiscale tomography study of eutectic structures in aluminium silicon foundry alloys

Image Analysis & Stereology (2015)

Michael Engstler Jenifer Barrirero Frank Mücklich

Foundry

Source

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Microstructure Tomography in the Micro, Nano and Atomic scale – Advanced Access to Understand Local Formation as well as Degradation of Materials Microstructure

Microscopy and Microanalysis (2010)

Frank Muecklich Michael Engstler

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Degradation

Atomic units

10.1017/s1431927610063154

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Homogeneity Quantification Method and its Application to Microstructure Assessment Verfahren zur Quantifizierung der Homogenität und seine Anwendung in der Mikrostruktur

P. Rossi Michael Engstler Frank Mücklich

In this work, a method to precisely define and quantify homogeneity of microstructures is proposed. Said method is based on an interpretation of the Gini index and it was developed specifically for microstructure homogeneity assessments. Object homogeneity and region homogeneity are examples of parameters developed to describe different aspects of homogeneity in micrographs. Using these parameters, the homogeneities of Al-Si casting alloys and cast iron have been evaluated. The method can be adapted and combined with other techniques to fit the requirements of a given study case. Further applications of the method are discussed.

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Phase Continuity, Brittle to Ductile Transition Temperature, and Creep Behavior of a Eutectic Mo–20Si–52.8Ti Alloy

Advanced Engineering Materials (2022)

Aditya Srinivasan Tirunilai Frauke Hinrichs Daniel Schliephake Michael Engstler Frank Mücklich

Mo–Si–Ti alloys, like eutectic Mo–20Si–52.8Ti (at%), have previously been intensely investigated, owing to their excellent oxidation and creep resistance. To better understand high‐temperature mechanical behavior, a holistic assessment of microstructural features is necessary. Correspondingly, 3D‐focused ion beam tomography is carried out in Mo–20Si–52.8Ti. The results indicate a severely interconnected network of Mo solid solution (Mo SS ) and intermetallic (Ti,Mo) 5 Si 3 . Both phases retain similar network connectivity, lamellar sizes, etc. The brittle to ductile transition temperature (BDTT) is then determined through a series of bending tests and interpreted using the microstructural information. The BDTT is found to be ≈1100–1150 °C, different from Mo–9Si–8B with a continuous Mo SS network. The BDTT is an immediate consequence of the continuous network of both Mo SS and (Ti,Mo) 5 Si 3 . The Mo SS network is instrumental in crack trapping and bridging, indicating that the present phase distribution maximized the mechanical performance over (Ti,Mo) 5 Si 3 . Having determined the network microstructure and BDTT, tensile creep behavior is evaluated and compared to previously published compressive creep results. The results show consistency in terms of strain rate, stress exponent, and microstructural features indicating a reliably good creep resistance for the network microstructure of Mo–20Si–52.8Ti regardless of loading direction.

Brittleness

10.1002/adem.202200918

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Citations (3)

“Smart Microscopy”: Feature Based Adaptive Sampling for Focused Ion Beam Scanning Electron Microscopy

Microscopy and Microanalysis (2016)

Tim Dahmen Niels de Jonge Patrick Trampert Michael Engstler Christoph Pauly

Journal Article “Smart Microscopy”: Feature Based Adaptive Sampling for Focused Ion Beam Scanning Electron Microscopy Get access Tim Dahmen, Tim Dahmen German Research Center for Artificial Intelligence, Saarbrucken, Germany Search for other works by this author on: Oxford Academic Google Scholar Niels de Jonge, Niels de Jonge INM - Leibniz Institute for New Materials, Saarbrucken, Germany Search for other works by this author on: Oxford Academic Google Scholar Patrick Trampert, Patrick Trampert German Research Center for Artificial Intelligence, Saarbrucken, GermanySaarland University, Saarbrucken, Germany Search for other works by this author on: Oxford Academic Google Scholar Michael Engstler, Michael Engstler Saarland University, Saarbrucken, Germany Search for other works by this author on: Oxford Academic Google Scholar Christoph Pauly, Christoph Pauly Saarland University, Saarbrucken, Germany Search for other works by this author on: Oxford Academic Google Scholar Frank Mücklich, Frank Mücklich Saarland University, Saarbrucken, Germany Search for other works by this author on: Oxford Academic Google Scholar Philipp Slusallek Philipp Slusallek German Research Center for Artificial Intelligence, Saarbrucken, GermanySaarland University, Saarbrucken, Germany Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 632–633, https://doi.org/10.1017/S1431927616004013 Published: 25 July 2016

Feature (linguistics)

10.1017/s1431927616004013

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