ADVERTISEMENT RETURN TO ISSUEPREVArticleNEXTPhotoelectrochemical behavior of C60 filmsB. Miller, J. M. Rosamilia, G. Dabbagh, R. Tycko, R. C. Haddon, A. J. Muller, W. Wilson, D. W. Murphy, and A. F. HebardCite this: J. Am. Chem. Soc. 1991, 113, 16, 6291–6293Publication Date (Print):July 1, 1991Publication History Published online1 May 2002Published inissue 1 July 1991https://doi.org/10.1021/ja00016a067Request reuse permissionsArticle Views397Altmetric-Citations110LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InReddit PDF (418 KB) Get e-Alertsclose Get e-Alerts
To determine the effect of exposure to halogenated solvents on electrolytic-capacitor lifetime, populations of these capacitors were exposed to accelerated testing. It is shown that halogenated solvents cause electrolytic capacitors to fail open at the anode. The electrolytic corrosion, which dissolves the passivating oxide layer on the anodically biased aluminum and exposes a clean aluminum surface, is the rate limiting step in the failures. Halogenated solvents then readily react with the aluminum surface and erode the electrode until the solvent is consumed. The increase in pressure inside the capacitor can cause the capacitor to vent, further accelerating failure. Accelerated life testing of one of the capacitor types considered suggests that it may fail at normal operating conditions in 2-3 years. Monitoring of capacitor characteristics during the accelerated life test shows that changes in these characteristic parameters cannot be used to predict failure.< >
A particle analyser is described that simultaneously detects and characterizes <0.02 to >10 mu m diameter particles independent of particle composition in real time. No previous instrument has been able to perform these functions simultaneously. Our design uses pulsed laser ablation of particles followed by time-of-flight mass spectrometric analysis of the resulting ions. The ion intensity is related to particle size at least for small particles. Thus particle size information is obtained concurrently with the other information.