Jinxi Bai

China Academy of Engineering Physics

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i-10 index

Research Trends

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Co-Authors

Zhendong Shi

Tianjin Medical University Cancer Institute and Hospital

Xiaohan Chen

Shandong University

Liqun Chai

China Academy of Engineering Physics

Huan Ren

Hebei Medical University

Lijia Liu

Shanghai Dianji University

Ping Li

Xi'an Jiaotong University

Binghai Liu

Huazhong University of Science and Technology

Hua Ma

China Academy of Engineering Physics

Qiongyu Hu

Shandong University

Hua Ma

Air Force Engineering University

Cooperative Institutions

China Academy of Engineering Physics

Shandong University

Zhejiang University

Laser Fusion Research Center

Laser Research Institute

Chinese Academy of Sciences

Shanghai Jiao Tong University

Nanjing University of Science and Technology

Tsinghua University

University of Science and Technology of China

Author Statistics

Papers

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Research Field

Au nanocages/SiO₂ as saturable absorbers for passively Q-switched all-solid-state laser

Materials Research Express (2018)

Lili Wang Xiaohan Chen Jinxi Bai Binghai Liu Qiongyu Hu

Based on Au nanocages/SiO2 (Au-NCs/SiO2) as saturable absorber (SA), passively Q-switched Nd:YVO4 lasers with the output couplers (OCs) with the transmittance (T) of 4% and 10.8% were demonstrated, respectively. Q-switched pulse with the shortest pulse duration of 154.2 ns was achieved at T = 4% under the pump power of 2.11 W with the corresponding repetition rate of 280.0 kHz and average output power of 140.6 mW. While the maximum average output power of 150.2 mW was obtained at T = 10.8% under the pump power of 2.42 W, corresponding to the pulse width and repetition rate of 222.0 ns and 279.1 kHz.

Nanocages

Saturable absorption

Q-switching

Pulse duration

Output coupler

10.1088/2053-1591/aabe11

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Citations (1)

Super-resolution Imaging of Submicron Natural Defects on Optics Component by Structured Illumination Microscopy

Journal of Physics Conference Series (2023)

Jinxi Bai Lin Zhang Hua Ma Zhendong Shi Lijia Liu

Abstract We report a super-resolution imaging microscope adopting the spatially structured illumination that is able to providing super-resolution and high signal noise ratio images of submicron defects on the surface and subsurface of optical components in this research. Employing the combination of structured illumination microscopy (SIM) and reflective light scattering (RLS) microscope, RLS-SIM extends the transmission band of optical transfer function of the RLS microscopy, thereby improving resolution and breaking the conventional Rayleigh diffraction limit. With 633 nm illumination light source and 100×/0.8 objective, the reconstructed RLS-SIM image of natural defects on the optics component reveals the lateral limit resolution ~296 nm, a factor of 1.63 than that of the normal bright-field microscopy with the same parameters. Moreover, compared with traditional microscope (bright-field/dark-field) and SEM images, the RLS-SIM images are demonstrated to present the finer structures of submicron digs and scratches formed in the optics manufacturing process which have a good application prospect in the research of damage mechanism of precision optical components and the upgrading of processing technology.

Dark field microscopy

Optical transfer function

10.1088/1742-6596/2464/1/012011

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A Real-Time Peak Extraction Algorithm for Dynamic Displacement Measurement Based on Spectral Confocal Microscopy

Journal of Physics Conference Series (2021)

Lijia Liu Hua Ma Zhendong Shi Jinxi Bai Lin Zhang

Abstract Spectral confocal is widely used in various fields such as topography detection, roughness measurement, thickness measurement, for its advantages ability in displacement measurement. Developed from confocal microscopy, the spectral confocal microscopy greatly improves the efficiency of displacement measurement because there is no need for longitudinal scanning, In other words, we need to obtain the wavelength information corresponding to the peak point of the spectral signal, which is called peak abscissa but not the peak value. Therefore, Accurate and efficient peak abscissa calculation algorithm occupies an important position in displacement monitoring based on spectral confocal. However, the existing methods are too complex to apply to real-time dynamic online detection, for they usually focus on determining the peak value by means of curve fitting and peak extraction. In this paper, we proposed an efficient and accurate peak abscissa calculation method by shifting, difference, linear fitting, zero point and peak abscissa calculation (SDLZ). Compared with the Gaussian fitting method, the results demonstrate that the SDLZ can greatly improve efficiency, can be applied to field programmable gate array microcontrollers, with high measurement accuracy, providing key solutions for equipment needs.

10.1088/1742-6596/2112/1/012015

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Citations (2)

Yb-doped fiber laser mode-locked with Au nanocages/SiO2 saturable absorber

Optical and Quantum Electronics (2019)

Jinxi Bai Zhendong Shi Hua Ma Liqun Chai Huan Ren

Nanocages

Saturable absorption

Mode-Locking

Mode (computer interface)

10.1007/s11082-019-1847-3

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Citations (3)

Research of multi-pulses emission in passively Q-switched Nd3+:YAG microchip laser

Optik (2016)

Ping Li Teng Song Jinxi Bai Yangyang Dun Xiaohan Chen

Q-switching

Oscillation (cell signaling)

Pulse repetition frequency

Repetition (rhetorical device)

10.1016/j.ijleo.2016.12.006

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Citations (2)

Q-switched Nd:GdVO4 laser based on gold nanotriangles saturable absorbers

Optical and Quantum Electronics (2018)

Lili Wang Jinxi Bai Xiaohan Chen Qiongyu Hu Binghai Liu

Saturable absorption

Pulse duration

10.1007/s11082-018-1329-z

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Citations (3)

The Influence of Noise in the Super-Resolution Reconstruction of Structured Illumination Microscopy

Journal of Physics Conference Series (2021)

Jinxi Bai Zhendong Shi Hua Ma Lijia Liu Lin Zhang

Abstract As one of the mainstream super-resolution imaging technologies, structured illumination microscopy (SIM) is popular for its fast imaging speed and simple optical path structure. Spectrum separation is a key step in the reconstruction of super-resolution images. However, in the process of imaging, the unavoidable noise will seriously affect the accuracy of frequency spectrum separation. This paper carries out a simulation study on the influence of noise in the process of frequency spectrum separation. The results show that although noise can cause distortion of low-frequency information in frequency spectrum separation results, it has little influence on high-frequency information. Therefore, a super-resolution image reconstruction method is proposed to effectively suppress the influence of noise. Both simulation and experimental results are shown the method can suppress the influence of noise without losing the details of super-resolution.

Distortion (music)

10.1088/1742-6596/2112/1/012012

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Research on Digital Testing Technology for Full Surface Defects of Cross scale Heteromorphic Metal Devices

Journal of Physics Conference Series (2023)

Lijia Liu Hua Ma Jinxi Bai Zhendong Shi Lin Zhang

Abstract There are many types of cross scale special-shaped metal components in various fields, and the surface quality (defects) of some key components will affect the device performance and even cause the long-term stability and reliability of the system to decline. The existing manual inspection methods are difficult to accurately quantify and establish a digital traceability database, so it is urgent to study the automatic digital inspection technology of full surface defects. However, most of the devices are curved surfaces with different shapes, large size spans, various types of surface defects and diffuse reflection imaging, and the background of machine vision images is complex, which greatly increases the difficulty of defect detection. Based on the principle of machine vision imaging, this paper designs a long depth of field and low distortion imaging system for curved surfaces. Combined with a flexible scanning motion mechanism with multiple degrees of freedom, this paper studies the technology of complex background defect extraction to realize the full surface defect detection of cross scale special-shaped metal devices.

Traceability

Distortion (music)

Reflection

10.1088/1742-6596/2464/1/012034

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Diode-pumped passively Q-switched Nd:YAG ceramic laser with a gold nanotriangles saturable absorber at 1 µm

Applied Physics Express (2017)

Jinxi Bai Ping Li Xiaohan Chen Lei Guo Lili Wang

Passively Q-switched Nd:YAG ceramic lasers at 1064 and 1123 nm are demonstrated based on a gold nanotriangles saturable absorber (GNTs-SA) for the first time. The maximum average output power reaches 226 mW at 1064 nm and 172 mW at 1123 nm with corresponding shortest pulse widths and maximum pulse repetition rates of (179 ns, 320 kHz) and (231 ns, 457 kHz), respectively. Our results prove that the GNTs-SA is a promising saturable absorber around the 1-µm region.

Saturable absorption

Pulse repetition frequency

Q-switching

10.7567/apex.10.082701

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Citations (7)

Light Source Optimization of 3D Inner Contour Measurement System Based on Ring Beam Method

Journal of Physics Conference Series (2023)

Hua Ma Zhendong Shi Jinxi Bai Lijia Liu Lin Zhang

Abstract Ring beam method is a simple and efficient method for measuring three-dimensional internal contour. The whole three-dimensional inner contour is stitched from the contour lines of cross-sectional images collected during scanning. The contour image with uniform and moderate light intensity and fine ring band is beneficial to the calculation of contour line extraction algorithm. In practice, due to the quality of the ring beam and the modulation effect of the sample surface microstructure, the light band of the contour image has local widening, overexposure and speckle phenomena, which directly affect the contour extraction effect. The ring beam generation system is optimized here, which makes the whole system have better size adaptability and convenient adjustment. In addition, experiments results show that the measurement repeatability of the cross-sectional profile obtained after the light source optimization has been effectively improved.

Contour line

Repeatability

Sample (material)

10.1088/1742-6596/2464/1/012021

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