Haruji Futami

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Takeshi Iwasaki Masao Aso Haruji Futami Satoshi Matsunaga Y. Miyake

The IP session highlights three innovative test practices in Asia, which include a testing solution for the millimeterwave (76- to 81- GHz) without expensive instruments, an on-chip delay measurement method for in-field test and a power control method of at-speed scan test for IR violation reduction. These would be useful for automotive and IoT application device testing.

Automotive electronics

10.1109/vts48691.2020.9107640

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Aging Observation using On-Chip Delay Measurement in Long-term Reliability Test

IEICE Technical Report; IEICE Tech. Rep. (2019)

Y. Miyake Takaaki Kato Seiji Kajihara Masao Aso Haruji Futami

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On-Chip Delay Measurement for Degradation Detection And Its Evaluation under Accelerated Life Test

Y. Miyake Takaaki Kato Seiji Kajihara Masao Aso Haruji Futami

Periodical delay measurement in field is useful for not only detection of delay-related faults but also prediction of faults due to aging. Logic BIST with variable test clock generation enables on-chip delay measurement in field. This paper addresses a delay measurement scheme based on logic BIST and gives experiment results to observe aging phenomenon of test chips under accelerated life test. The measurement scheme consists of scan-based logic BIST, a variable test clock generator, and digital temperature and voltage sensors. The sensors are used to compensate measured delay values for temperature and voltage variations in field. Evaluation using SPICE simulation shows that the scheme can measure a circuit delay with resolution of 92 ps. The delay measurement scheme is also implemented on fabricated test chips with 180 nm CMOS technology and accelerated test is performed using ATE and burn-in equipment. Experimental results show that a circuit delay increased 552 ps when accelerated the chip for 3000 hours. It is confirmed that the on-chip delay measurement scheme has enough accuracy for detection of aging-induced delay increase.

Spice

Built-in self-test

Degradation

10.1109/iolts50870.2020.9159717

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