Thomas G. Brown

University of Rochester

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Miguel A. Alonso

Aix-Marseille Université

Amber M. Beckley

Polytechnique Montréal

Michael J. Theisen

Sonoma Technology (United States)

Zhaoming Zhu

Meta (Israel)

Dennis G. Hall

University of Alberta

Katelynn A. Sharma

University of Rochester

Tyler V. Howard

University of Rochester

David P. Biss

Oikos University

D. F. Prelewitz

University of Rochester

C. Martijn de Sterke

University of Sydney

Cooperative Institutions

University of Rochester

124

Hôpital Notre-Dame

Government of Spain

Instituto de Óptica "Daza de Valdés"

Lawrence Livermore National Laboratory

Energetics (United States)

Harvard University

Princeton University

Princeton Plasma Physics Laboratory

Centre National de la Recherche Scientifique

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Measurement of radiation induced transients in hybrid microcircuits by magnetic thin film sensor/recorders

E.J. Hsieh K. E. Vindelov Thomas G. Brown Douglas E. Miller

Magnetic thin film transient current sensor/recorders were modified to make two types of nuclear test measurements, transient currents in hybrid microcircuits and internal electromagnetic pulse (IEMP) fields. The measurements were made possible by the invention of split-domain sensor/recorders which can measure bilateral currents and can be reset and readout on location. The sensor/recorders were used in two underground nuclear tests and numerous calibration tests in radiation-simulation machines. The data showed that the nuclear environment had negligible effect on the sensor/recorder's operation and the recorded informations on the sensor/recorders were the signals intended to be monitored. Also, the experimental data agreed with the theoretical analysis in controlled experiments. The data were examined first by on location readout with a magnetic tape viewer and later by Kerr magneto-optic readout in the laboratory. To translate the data into current readings, we reconstructed facsimile data (on each of the sensor/recorders) in the laboratory by current pulses with the same pulse width as the radiation event. An additional check on the accuracy of the data was made by using both the sensor/recorder and the conventional pickup-oscilloscope-camera technique to monitor the same current lead in a simulated radiation environment. Over five runs were made, and the agreement among the two measurement methods was within 25%. The data collectively implied that the measurements were reliable and dependable.

Transient (computer programming)

Current sensor

Pickup

Analyser

10.2172/7126263

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Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX

SPIE eBooks (2012)

José-Angel Conchello Carol J. Cogswell Tony Wilson Thomas G. Brown

Source

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Citations (3)

Stress birefringent, space-variant wave plates for vortex illumination

Applied Optics (2006)

Alexis K. Spilman Thomas G. Brown

We describe the use of stress birefringence in the creation of vortex illumination. A trifold symmetric stress pattern will provide an annular region that exhibits polarization vortices when illuminated with linearly polarized light and scalar vortices when illuminated with circularly polarized light. A finite element plane-stress model is used to analyze the space-variant anisotropy.

Optical vortex

10.1364/ao.46.000061

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Citations (68)

Super-resolution imaging with simultaneous 3D spatial localization and 3D orientation behavior characterization for single emitters.

Sophie Brasselet Miguel A. Alonso Valentina Curcio Luis A. Alemán Castañeda Thomas G. Brown

Characterization

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Utilizing fluorescent beads to mimic single fluorophores

Yi-Ting Feng Luis A. Alemán-Castañeda Rodrigo Gutiérrez–Cuevas Isael Herrera Thomas G. Brown

In this paper, numerical and semi-analytical methods are used for studying how well a fluorescent bead with a given radius in a polarizer-supplemented microscopy setup, can emulate a single fluorescent molecule.

Polarizer

Bead

Single-molecule experiment

10.1117/12.2664958

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Engineered scattering elements used as optical test points in photonic integrated circuits

Journal of Optical Microsystems (2023)

Tyler V. Howard Icel Sukovaty Thomas G. Brown

Efficient packaging of fabricated photonic integrated circuits (PICs) has been a daunting task given the breadth of applications and skill required for scalable manufacturing. One particular challenge has been accurately assessing the polarization state at various points in a PIC during the test, assembly, and packaging process. Polarimetric monitoring is necessary for optimizing fiber alignment, for verifying the quality of PIC components and for polarization-related functional testing. We analyze and demonstrate small-footprint engineered scattering elements for polarization monitoring. We find that small scatterers placed above or below a Si or SiN waveguide provide the best polarization integrity in a way that preserves foundry compatibility. The polarization response of these elements along with proper placement provides an optical test point that can be utilized for optimized fiber coupling into waveguides.

10.1117/1.jom.4.1.011002

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Weak measurements applied to process monitoring using focused beam scatterometry

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (2014)

Thomas G. Brown Miguel A. Alonso Anthony Vella Michael J. Theisen Stephen T. Head

The capacity to measure nanoscale features rapidly and accurately is of central importance for the monitoring of manufacturing processes in the production of computer integrated circuits. Parameters of interest include, for example, trench depth, duty cycle, wall angle and oxide layer thickness. The measurement method proposed here uses focused beam scatterometry, in which the illumination consists of a focused field with a suitably tailored spatially-varying polarization distribution. In an analysis that is analogous to classical off-null measurements as well as weak measurements in quantum mechanics, we predict that four or more parameters can be measured and distinguished with an accuracy consistent with the needs laid out in the semiconductor roadmap.

Duty cycle

Semiconductor device fabrication

10.1117/12.2046528

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<title>Evidence of enhanced fluorescence via cross coupling in an integrated thin-film fluorescence sensor</title>

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (1999)

Meg L. Tuma Russell W. Gruhlke Thomas G. Brown

A fluorescence sensor-system has been proposed that integrates optical and electronic components in a thin-film geometry. Predicted properties of this sensor include: increased sensitivity, shielding form unwanted radiation, wavelength filtering, potential operation at high temperatures, and miniaturization. The sensor can be tuned to measure a wide variety of species by varying its thin- film corrugation period. The optical properties of the sensor are determined, in large part, by optical cross coupling through a corrugated metal film and enhanced fluorescence. Measurements evaluating these processes are presented.

10.1117/12.365754

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Citations (2)

Stress engineering and the applications of inhomogeneously polarized optical fields

Frontiers of Optoelectronics (2013)

Thomas G. Brown Amber M. Beckley

Stress field

10.1007/s12200-012-0307-5

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Citations (8)

An Explanation of the Principles of Ultrasonic Echo Sounding [Summary]

Proceedings of the Royal Society of Medicine (1962)