Old Web
English
Sign In
Acemap
>
authorDetail
>
S. Fox
S. Fox
National Institute of Standards and Technology
Metrology
Dimensional metrology
Nanometre
Optical imaging
Nondestructive testing
1
Papers
0
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (1)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Characterization of CCD cameras and optics for dimensional metrology
2001
Characterization and Metrology for ULSI Technology
S. Fox
Edward Kornegay
Richard M. Silver
Show All
Source
Cite
Save
Citations (0)
1