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Christina Seidleck

Raytheon

5

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Microsemi RTG4 Rev C Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report

2019
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Single-Event Effect Performance of a Conductive-Bridge Memory EEPROM

2015 IEEE Transactions on Nuclear Science
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A comparative study of heavy-ion and proton-induced bit-error sensitivity and complex burst-error modes in commercially available high-speed SiGe BiCMOS

2004 IEEE Transactions on Nuclear Science
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