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William J. DeVore
William J. DeVore
Optics
Analytical chemistry
Beam diameter
Scanning electron microscope
Energy-dispersive X-ray spectroscopy
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Electron-electron interaction induced beam displacement in a multiple electron beam system
2005
Journal of Vacuum Science & Technology B
Ming L. Yu
Steven T. Coyle
William J. DeVore
Bassam Shamoun
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