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Philippe C. Adell
Philippe C. Adell
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Non-volatile memory
Electronic engineering
Engineering
Magneto
MBus
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Single event effect assessment of a 1-Mbit commercial magneto-resistive random access memory (MRAM)
2017
REDW | Radiation Effects Data Workshop
Philippe C. Adell
Slaven Moro
Lionel Gouyet
Christian Chatry
Bert Vermeire
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