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J. Bialas
J. Bialas
IBM
Electronic circuit
Input/output
Gate oxide
MOSFET
CMOS
1
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Accelerated gate-oxide breakdown in mixed-voltage I/O circuits
1997
IRPS | International Reliability Physics Symposium
Toshiharu Furukawa
D. Turner
Steven W. Mittl
M. Maloney
R. Serafin
William F. Clark
J. Bialas
L. Longenbach
J. Howard
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Citations (43)
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