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James B. Friedmann
James B. Friedmann
Texas Instruments
Contact pad
Trimming
Transistor
Surface finish
Electronic engineering
1
Papers
3
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Characterization of bending CD errors induced by resist trimming in 65 nm node and beyond
2007
Proceedings of SPIE
Yiming Gu
James B. Friedmann
Vladimir A. Ukraintsev
Gary Zhang
Thomas Wolf
Tom Lii
Ricky A. Jackson
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