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Christian Barth
- University of Geneva
22
Papers
280
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- Machine learning applied to X-ray tomography as a new tool to analyze the voids in RRP Nb 3 Sn wires2021 Scientific Reports
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Citations (6) - 2018 Scientific ReportsShow All
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Citations (7) - Very-high thermal and electrical conductivity in overpressure-processed Bi 2 Sr 2 CaCu 2 O 8+x wiresShow All
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- A. Kario
- S. Otten
- A. Kling
- U. Mirasch
- W. Goldacker
- Carmine Senatore
- Christian Barth
- Marco Bonura
- Y. Yang
- Antti Stenvall
- Marc M.J. Dhalle
- Peng Gao
- S. Wessel
- Alexander Usoskin
- A Rütt
- G. Kirby
- J. van Nugteren
- H. Bajas
- V. Benda
- A. Ballarino
- M. Bajko
- L. Bottura
- K. Broekens
- M. canale
- A. Chiuchiolo
- J. Fleiter
- Luca Gentini
- Nicolas Peray
- J.C. Perez
- G. de Rijk
- A. Rijllart
- L. Rossi
- J. Murtomaeki
- J. Mazet
- Francois-Olivier Pincot
- Clement Lorin
- M. Durante
- P. Fazilleau
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