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O. Crépel
O. Crépel
Materials science
Optoelectronics
Degradation (geology)
Silicon carbide
Power MOSFET
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Backside Laser Testing of Single-Event Effects in GaN-on-Si Power HEMTs
2021
IEEE Transactions on Nuclear Science
C. Ngom
Vincent Pouget
M. Zerarka
F. Coccetti
A. D. Touboul
M. Matmat
O. Crépel
S. Jonathas
G. Bascoul
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