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Jiang Hai
Jiang Hai
Samsung
Engineering physics
Extreme ultraviolet lithography
Multiple patterning
Electronic engineering
Optoelectronics
3
Papers
9
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Reliability on Evolutionary FinFET CMOS Technology and Beyond
2020
IEDM | International Electron Devices Meeting
Kihyun Choi
Hyun Chul Sagong
Minjung Jin
Jiang Hai
Miji Lee
Tae-Young Jeong
Myung-Soo Yeo
Hyewon Shim
Da Ahn
Wooyeon Kim
Yongjeung Kim
Junekyun Park
Hwa-Sung Rhee
Eun-Cheol Lee
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Enhanced Reliability of 7nm Process Technology featuring EUV
2019
VLSIT | Symposium on VLSI Technology
Kihyun Choi
Hyun Chul Sagong
Wonchang Kang
Hyun-Jin Kim
Jiang Hai
Miji Lee
Bomi Kim
Soonyoung Lee
Hyewon Shim
Junekyun Park
Young-woo Cho
Hwasung Rhee
Sangwoo Pae
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Citations (5)
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