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Yong Jei Lee

Samsung

5

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100

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Extended scalability of perpendicular STT-MRAM towards sub-20nm MTJ node

2011 IEDM | International Electron Devices Meeting
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A 192×108 pixel ToF-3D image sensor with single-tap concentric-gate demodulation pixels in 0.13 µm technology

2011 IEDM | International Electron Devices Meeting
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Advanced image sensor technology for pixel scaling down toward 1.0µm (Invited)

2008 IEDM | International Electron Devices Meeting
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Citations (22)