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D. Nagalingam

GlobalFoundries

6

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11

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Cross Sectional Passive Voltage Contrast Approach for Gate Oxide Breakdown Defect Isolation and Visualization for TEM Analysis

2020
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Sample Preparation in Recover Physical Defects on MIM Related failure for Different Devices In Wafer Fabrication

2019 IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
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Static fault localization of subtle metallization defects using near infrared photon emission microscopy

2017 Microelectronics Reliability
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