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Tim Haeffner
Tim Haeffner
Radiation
Irradiation
Silicon on insulator
Angle of incidence
Voltage
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14/16nm FinFET Radiation Response Characterization
2016
J. S. Kauppila
H. Jiang
H. Zhang
T. Assis
T. D. Loveless
Tim Haeffner
Andrew L. Sternberg
D. R. Ball
J.D. Rowe
B. L. Bhuva
Michael L. Alles
Lloyd W. Massengill
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