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F. Samek
F. Samek
Microstructure
Sputtering
Critical point (thermodynamics)
Nuclear magnetic resonance
Thin film
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Study of the correlation between the structure and critical temperatureTc of sputtered Nb-Ge films
1985
Czechoslovak Journal of Physics
A. I. Skvortsov
N. E. Khlebova
N. I. Kozlenkova
B. D. Zheleznyakov
J. Růžička
J. Pracharova
F. Samek
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