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Wei-Min Wu

Katholieke Universiteit Leuven

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Wafer-Level LICCDM Device Testing

2021
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ESD Protection Diodes in Sub-5nm Gate-All-Around Nanosheet Technologies

2020
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Optimization of Wafer-Level Low-Impedance Contact CDM Testers

2020
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Low-Impedance Contact CDM – Evaluation and Modeling

2019 Electrical Overstress/Electrostatic Discharge Symposium
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