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Keneth R. Wilsher
Keneth R. Wilsher
Electronic engineering
Computer science
Detector
Jitter
Chip
5
Papers
30
Citations
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Backside E-Beam Probing on Nano scale devices
2007
ITC | International Test Conference
Rudolf Schlangen
R. Leihkauf
Uwe Kerst
Christian Boit
Rajesh Jain
Tahir Malik
Keneth R. Wilsher
Ted R. Lundquist
Bernd Krüger
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Designed -in-diagnostics: a new optical method
2003
ITC | International Test Conference
Keneth R. Wilsher
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An ultra-low dark-count and jitter, superconducting, single-photon detector for emission timing analysis of integrated circuits
2003
Microelectronics Reliability
P. LeCoupanec
William Lo
Keneth R. Wilsher
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Practical, non-invasive optical probing for flip-chip devices
2001
ITC | International Test Conference
G. Dajee
N. Goldblatt
Ted R. Lundquist
Steven Kasapi
Keneth R. Wilsher
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Optical interferometric probing of advanced microprocessors
2000
ITC | International Test Conference
Travis M. Eiles
Keneth R. Wilsher
William Lo
G Xiao
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Citations (8)
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