Login
中文
Youseok Suh
HIndex: 9
Follow
Share
I Know This Author
Publication
Citation
Affiliation
Research Interests
Anything in here will be replaced on browsers that support the canvas element
CMOS
Double layer
Thin film
Temperature
X-ray crystallography
Dielectric
co development
Electrode
Annealing
Sputtering
Kinetics
Silicon
Equivalent oxide thickness
Argon
International System of Units
Work function
Schottky barrier
Physical property
Hafnium
Nitrogen
Thermal stability
Stability
Transmission electron microscopy
X-ray photoelectron spectroscopy
Ruthenium
Co-author Map
More
Mentorship
More
Papers
Ranking by:
Time
Paper rank
Research Area:
All Area
CMOS
Double layer
Thin film
Temperature
X-ray crystallography
Dielectric
co development
Electrode
Annealing
Sputtering
Kinetics
Silicon
Equivalent oxide thickness
Argon
International System of Units
Work function
Schottky barrier
Physical property
Hafnium
Nitrogen
Thermal stability
Stability
Transmission electron microscopy
X-ray photoelectron spectroscopy
Ruthenium
Paper Recommendation
×
Match this author profile with one of the following researchers:
Author Name
Affiliation
Papers
Youseok Suh
North Carolina State University
22
×
Share to your followers
Submit