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Y M Lin
HIndex: 16
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International System of Units
Copper
Reliability
Nanotechnology
Carbon nanotube
Speed of light
Dielectric
Leakage
Film
Nitrogen
Nanowire
Mathematical optimization
Dynamic range
Field-effect transistor
Voltage
Effective mass
Graphene
Radio frequency
Bismuth
CMOS
Logic gate
Stress
Chemical-mechanical planarization
Metal
Silicon
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International System of Units
Copper
Reliability
Nanotechnology
Carbon nanotube
Speed of light
Dielectric
Leakage
Film
Nitrogen
Nanowire
Mathematical optimization
Dynamic range
Field-effect transistor
Voltage
Effective mass
Graphene
Radio frequency
Bismuth
CMOS
Logic gate
Stress
Chemical-mechanical planarization
Metal
Silicon
Paper Recommendation
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Match this author profile with one of the following researchers:
Author Name
Affiliation
Papers
Y M Lin
National Tsing Hua University
120
Y M Lin
National Cheng Kung University
37
Y M Lin
Massachusetts Institute Of Technology
8
Y M Lin
Peking University
7
Y M Lin
National Chung Hsing University
4
Y M Lin
Nust School Of Civil And Environmental Engineering
4
Y M Lin
Chang Gung University
4
Y M Lin
Imperial College London
3
Y M Lin
University At Albany Suny
2
Y M Lin
Massachusetts Institute Of Technology
2
Y M Lin
University Of Nebraska Lincoln
1
Y M Lin
University Of Hong Kong
1
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