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O Auciello
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Dielectric
Electrical resistivity and conductivity
Room temperature
Atomic force microscopy
Electric field
Ion beam
Materials Science
Mass spectrometry
Material properties of diamond
High frequency
X-ray crystallography
Single crystal
Grain boundary
Thin film
Ferroelectricity
Microstructure
Sputtering
Deposition
Field electron emission
Dielectric loss
Chemical vapor deposition
Copper
Real-time computing
Film
Leakage
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Dielectric
Electrical resistivity and conductivity
Room temperature
Atomic force microscopy
Electric field
Ion beam
Materials Science
Mass spectrometry
Material properties of diamond
High frequency
X-ray crystallography
Single crystal
Grain boundary
Thin film
Ferroelectricity
Microstructure
Sputtering
Deposition
Field electron emission
Dielectric loss
Chemical vapor deposition
Copper
Real-time computing
Film
Leakage
Paper Recommendation
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Affiliation
Papers
O Auciello
Institute For Materials Research
476
O Auciello
Argonne National Laboratory
7
O Auciello
University Of Toronto
3
O Auciello
Argonne National Laboratory
3
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